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2017 CINT Annual Meeting

2017 CINT Annual Meeting
September 25-27, 2017 at the La Fonda on the Plaza hotel in Santa Fe, New Mexico.
July 29, 2016
10 years of innovation Center for Nanotechnologies, Los Alamos Laboratory, Sandia National Laboratories

Event Planners  

  • Heather Brown (SNL)
  • Linda Chavez (LANL)
  • Shannon Perez (LANL)

The 2017 CINT User Meeting is sponsored in part by:


Satellite Event:

Joint NSRC Workshop on Soft Matter
September 25-27, 2017

Confirmed Plenary Speakers:

  • Professor Sankar Das Sarma, University of Maryland
  • Professor Thomas La Grange, École Polytechnique Fédérale de Lausanne
  • Professor M. Cristina Marchetti, Syracuse University

Symposia I: Joint NSRC Workshop on Soft Matter

Organizing Committee:

  • Gary S. Grest Center for Integrated Nanotechnologies
  • George Bachand Center for Integrated Nanotechnologies
  • Xiao-Min Lin Argonne National Laboratory
  • Oleg Gang Brookhaven National Laboratory
  • Ron Zuckerman Lawrence Berkeley National Laboratory
  • Bobby Sumpter Oak Ridge National Laboratory

Symposia II: Emergent Phenomena in Quantum Materials

CINT Organizers: Mike Lilly / Han Htoon / Rohit Prasankumar / Jianxin Zhu

Symposia III: Exploring New Frontiers in Chemistry and Physics with Electron Microscopy

CINT Organizers: Katherine Jungjohann/ Khalid Hattar/ Nathan Mara 


The Center for Integrated Nanotechnologies is guided for electron microscopy techniques towards exploring difficult systems and their controlling mechanisms to develop a better understanding of nano-integration. In particular, this center has developed a history in the use of electrochemical probing, nanomechanics and temperature control in the TEM. Our capabilities are being greatly broadened in 2017 to incorporate sub-angstrom-resolution imaging, custom environmental (gas) imaging, low-dose imaging through direct-electron detection, magnetic moment imaging of nanomaterials, and high-temporal resolution imaging in the TEM. To help provide a better understanding to our user community what these new capabilities can provide to their nanoscience experimental toolkit, we have gather experts in the field and mixed them with our current exceptional TEM users. The presentations in this symposium will cover an array of in-situ TEM techniques as well as sample preparation techniques that are critical to obtaining the highest quality information from our state-of-the-art electron microscopy facilities.