4D-STEM is capable of wide field-of-view (FOV) nano structural characterization with a spatial resolution on the order of 1 nm, giving users both strain and orientation information at the nanoscale in addition to whole-pattern diffraction analysis. This capability is available at the Core and Gateway facilities.

Capabilities include:

• Gatan STEMx system
• LBNL Patterned Probe aperture
• Computational workflows (python and MATLAB) and high-RAM workstation
• Gatan K2 direct electron detector (Core)
• Installed on the FEI ETEM microscope (Core)
• Gatan OneView camera (Gateway)
• Installed on the Titan 80–300 microscope (Gateway)

Contacts:
Stephen House (Core)
Matthew Schneider (Gateway)
Michael Pettes (Gateway)

Research Highlights:

Visualizing Grain Statistics in MOCVD WSe₂ Through Four-Dimensional Scanning Transmission Electron Microscopy
Londoño-Calderon, A.; Dhall, R.; Ophus, C.; Schneider, M.; Wang, Y.; Dervishi, E.; Kang, H. S.; Lee, C.-H.; Yoo, J.; Pettes, M. T. Nano Letters 2022, 22, 2578–2585. doi.org/10.1021/acs.nanolett.1c04315

Evidence of Intrinsic Helical Twist and Chirality in Ultrathin Tellurium Nanowires
Londoño-Calderon, A.; Williams, D. J.; Schneider, M. M.; Savitzky, B. H.; Ophus, C.; Ma, S.; Zhu, H.; Pettes, M. T. Nanoscale 2021, 13, 9606-9614. doi.org/10.1039/D1NR01442K

Local Lattice Deformation of Tellurene Grain Boundaries by Four-Dimensional Electron Microscopy
Londoño-Calderon, A.; Williams, D. J.; Schneider, M.; Savitzky, B. H.; Ophus, C.; Pettes, M. T.  The Journal of Physical Chemistry C 2021, 125, 3396–3405. doi.org/10.1021/acs.jpcc.1c00308