Center for Integrated Nanotechnologies

Helping you understand, create, and characterize nanomaterials

Magellan Scanning Electron Microscope

The ideal tool for investigating nanotubes, nanowires, nanocomposites, and other materials when workhorse SEMs lack the low-voltage resolution required for sensitive surface imaging

The FEI Magellan 400 SEM provides sub-nanometer spatial resolution from 1kV to 30 kV. By using low voltages, only the surface of the sample interacts with the electron beam and thus insulators/beam sensitive samples can be imaged without the need for conductive coatings and the amount of surface data is maximized.

Technical Specifications:

Contact: Chris Sheehan

Research Highlight:
Mapping Emission from Clusters of CdSe/ZnS Nanoparticles
Ryan, D. P; Goodwin, P. M.; Sheehan, C. J.; Whitcomb, K. J.; Gelfand, M. P.; Van Orden, A. The Journal of Physical Chemistry C 2018 122 (7), 4046-4053.

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