Center for Integrated Nanotechnologies

Helping you understand, create, and characterize nanomaterials

Small-Angle / Wide-Angle X-Ray Scattering

A state-of-the-art tool for characterizing size and structure of nanomaterials ranging 1-1000 nm

The versatile Xenocs Xeuss 3.0 supports wide q-range and covers USAXS, SAXS, and WAXS (0.0001–4.0 Å1) to characterize a wide range of nanomaterials
including polymers, biomacromolecules, and inorganic/metallic nanoparticles and films.

Capabilities include:

Technical Specifications:

Contact: Kyungtae Kim

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