More demanding electron-beam and optical microscopy and nanomechanics characterization studies may require specialized sample preparation for optimal results. For these studies, CINT maintains high-performance sample preparation tools to be used in conjunction with the characterization effort(s), including:

• Leica RES102 ion mill capable of the following four functions: (1) removing damage in TEM lamellae induced by focused ion beam tools, (2) thinning material to electron transparency for TEM inspection, (3) surface cleaning/polishing of planar surfaces for subsequent imaging and electron backscatter diffraction, and (4) cross-sectionional polishing for site-specific inspection of integrated circuits, printed circuit boards, etc. It is the only commercial ion mill capable of both TEM and SEM preparation.

• Leica TXP target preparation tool: an all-in-one tool for sawing, milling, drilling, grinding, and polishing for rough preparation of sample surfaces for subsequent optical and electron microscopies.

Contact: Brad Boyce