The Rigaku Ultima III is a powder diffractometer that operates in a theta/2theta mode and can analyze many different types of samples (bulk powders, thin-films and liquids).

Capabilities include:

• System is equipped with a standard powder stage, a thin-film stage, a small angle X-ray scattering stage (SAXS), and a Differential Scanning Calorimetry-X-ray Diffraction Stage (DSC-XRD) stage.
• Software to analyze bulk powders (Crystal Maker, Jade, GSAS), thin-film (diffraction, reflectivity, SAXS) and liquids that contain (Spherical, Core/Shell and Rods nanoparticles).

Contact: Darrick Williams

Research highlights:
Quasi-2D perovskite crystalline layers for direct conversion X-ray imaging.
Tsai, H.; Shrestha, S.; Pan, L.; Huang, H. H.; Strzalka, J.; Williams, D.; Wang, L.; Cao, L. R.; Nie, W. Advanced Materials 2022, 34 (13), 2106498. doi.org/10.1002/adma.202106498

Optically translucent BaFCl:Sm2+ scintillating micro-particle composites for radiation detection
Richards, C. G.; Williams, D. J.; Hehlen, M. P.; Hunter, J. F.; Wiggins, B. W. Optical Materials Express 2021, 11 (11), 3676. doi.org/10.1364/ome.427591

Intrinsic Helical Twist and Chirality in Ultrathin Tellurium Nanowire
Londoño-Calderon, A.; Williams, D. J.; Schneider, M. M.; Savitzky, B. H.; Ophus, C.; Ma, S.; Zhu, H.; Pettes, M. T. Nanoscale 2021, 13 (21), 9606–9614. doi.org/10.1039/d1nr01442k