Center for Integrated Nanotechnologies

Helping you understand, create, and characterize nanomaterials

Scios 2 Focused Ion Beam Scanning Electron Microscope for Materials Characterization and TEM Sample Preparation

Focused ion beam scanning electron microscope for high-resolution, high-quality sample preparation and 3D characterization

The Scios 2 LoVac dual-beam focused ion beam (FIB) scanning electron microscope (SEM) is a versatile tool for high-resolution imaging, 2D & 3D analysis, and high-quality sample preparation. A variety of conductive and non-conductive samples can be examined with the electron beam in high/low vacuum environments.

Capabilities include:

Technical Specifications:


Contact: Winson Kuo

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