Helping you understand, create, and characterize nanomaterials
Electron Beam Induced Current Microscopy — Upgrades Underway
Investigate electrical properties of single nanostructures and nanodevices with the spatial resolution of sub-50 nm. Morphological and functional characteristics can be concurrently investigated in a extreme high-resolution Magellan scanning electron microscope
Technical Specifications:
Multiprobe and SMA coaxial connectors.
Current resolution: 1 fA.
High impedance gain: 103 to 1011 V/A.
Visualization of current map and secondary electron images on the control windows.
