Center for Integrated Nanotechnologies

Helping you understand, create, and characterize nanomaterials

Electron Beam Induced Current Microscopy — Upgrades Underway

Investigate electrical properties of single nanostructures and nanodevices with the spatial resolution of sub-50 nm. Morphological and functional characteristics can be concurrently investigated in a extreme high-resolution Magellan scanning electron microscope

Technical Specifications:

Contact: Jinkyoung Yoo

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