Characterization equipment for electronic devices in controlled environments and temperature (light pulse, gas flow, temperature, etc) allows users to investigate electronic devices for different functional applications, including memory storage and neuromorphic computing.

• Suitable materials include dielectric, ferroelectric, insulating, and semiconducting thin films and devices.
• Test ferroelectric and dielectric thin films and capacitors at different temperatures for current voltage (I-V), polarization voltage (P-E), capacitance voltage (C-V), capacitance frequency (C-f), etc.

Equipment includes:

• E4980A LCR meter (20–2MHz).
• Multiferroic II Ferroelectric Tester (Radiant Technologies).
• Keithley Source Measure units.
• Keysight B1500A ultrafast pulse unit.
• Keithley 4200 semiconductor parameter analyzer.
• Room temperature probe station.
• Linkam temperature stage (-195^oC–600^oC).

Contact: Aiping Chen

Research Highlights:
Roles of Defect and Power Dispassion on Ferroelectric Memristive Switching
Roy, P.; Kunwar, S.; Zhang, D.; Chen, D.; Corey, Z.; Rutherford, B. X.; Wang, H.; MacManus‐Driscoll, J. L.; Jia, Q.; Chen, A. Advanced Electronic Materials 2022, 8 (6), 2101392. doi.org/10.1002/aelm.202101392

High performance, electroforming-free, thin film memristors using ionic Na0.5Bi0.5TiO3
Yun, C.; Webb, M.; Li, W.; Wu, R.; Xiao, M.; Hellenbrand, M.; Kursumovic, A.; Dou, H.; Gao, X.; Dhole, S.; Zhang, D.; Chen, A.; Shi, J.; Zhang, K. H.; Wang, H.; Jia, Q.; MacManus-Driscoll, J. L. Journal of Materials Chemistry C 2021, 9 (13), 4522–4531. doi.org/10.1039/D1TC00202C