CINT houses a variety of spectroscopic capabilities for characterization of both ensemble and individual optically active nanoparticles. Ensemble-level characterization includes the measurement optical properties across UV, VIS, NIR, and Mid-IR spectral ranges including: optical absorption spectroscopy, photoluminescence, and Fourier Transform Infrared spectroscopy. We also house a number of commercial and custom-built microscopes to characterize spectroscopic responses of individual nanostructures. These microscopy systems are equipped with a variety of tunable and fixed wavelength lasers which enable both the excitation and the spectroscopic characterization of individual nanostructures in the UV,VIS, and NIR spectral ranges.
Microscopic Capabilities include:
- Inverted and overhead confocal microscopes for the identification and imaging of individual nanostructures.
- Photoluminescence spectroscopy/microscopy of individual nanostructures in the VIS and NIR spectral ranges.
- Back Focal Plane (BFP) microscopic imaging for characterization of directional emission from individual nanostructures.
- Dark-Field scattering spectroscopy/microscopy of individual nanostructures.
- Transmission and Reflection spectroscopy of microscopic sample areas.
- FTIR microscope for characterization of transmission and reflection in the Mid-IR spectral range (Bruker Vertex 70 with Hyperion Microscope).
Ensemble Spectroscopic Capabilities include:
- Photoluminescence spectroscopy in the VIS and NIR spectral ranges with tunable lamp source excitation.
- Optical absorption spectroscopy.
- Raman spectroscopy.
- Fourier Transform Infrared Spectroscopy (FTIR).
- Time-Resolved Photoluminescence (TRPL).
Related Capabilities:
- Raman microscopy.
- Optical spectroscopy of individual semiconductor quantum emitters.
- Single nanostructure Magneto-optical microscopy.
