Center for Integrated Nanotechnologies

Helping you understand, create, and characterize nanomaterials

Atomic Force Microscopy

Routine and advanced imaging capabilities

CINT has multiple Atomic Force Microscopy (AFM) systems that can be leveraged to perform a variety of sample imaging modalities.  

AFM systems available to CINT users:

General Capabilities include:

The Bruker Dimension Icon Scanning Probe Microscope supports many advanced imaging features, including:

The Neaspec IR-neascope+fs supports the measurement of optical properties of surfaces using scattering-scanning near-field optical microscopy (s-SNOM).  These include:

Andy Jones
Dan Hooks

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