CINT has multiple Atomic Force Microscopy (AFM) systems that can be leveraged to perform a variety of sample imaging modalities.  

AFM systems available to CINT users:

• Bruker Dimension Icon
• Bruker Dimension FastScan
• Neaspec IR-neascope+fs
• Nanosurf Drive

General Capabilities include:

• General Atomic Force Microscopy — topography and phase imaging
• Nano-particle identification
• 4hz high quality topography scans with FastScan
• Surface roughness characterization

The Bruker Dimension Icon Scanning Probe Microscope supports many advanced imaging features, including:

• PeakForce® Quantitative nanomechanical mapping, with high-resolution high-stiffness upgrade
• Electrostatic Force Sensing modalities:
  • Electro-static Force Microscopy (EFM)
  • Kelvin Force Mircroscopy (KPFM)
  • Piezoresponse Force Microscopy (PFM)
  • Scanning current-voltage microscopy
  • Scanning Capacitance Microscopy (SCM)
• Electrochemical scanned probe microscopy
• Low-force nanoindentation
• Scanning Tunneling Microscopy (STM)
• Conductive/Photoconductive AFM — Peakforce Tunneling current AFM (PeakForce TUNA) with bottom illumination
• Magnetic Force Microscopy (MFM)
• Magneto-conductive atomic force microscopy (mc-AFM)

The Neaspec IR-neascope+fs supports the measurement of optical properties of surfaces using scattering-scanning near-field optical microscopy (s-SNOM).  These include:

• Nano-Vis — Mapping of the near-field optical response of surfaces in the visible spectral range
• Nano-IR — Resolution of the optical response of material surfaces in the Mid-IR spectral range using continuous wave illumination from a tunable Quantum Cascade Laser
• Nano-FTIR — Allows for nanoscale chemical identification by combining s-SNOM with FTIR
• Femtosecond s-SNOM: Studies dynamic processes in nanomaterials by combining pump-probe spectroscopy with nano-FTIR

Contacts:
Andy Jones
Dan Hooks
Brad Boyce
Kevin Garber