An XRD instrument comprised of a high-precision XRD platform with small-angle x-ray scattering, variable temperature, thin-film, and microdiffraction capabilities with a 2D area detector (HyPix 3000)
Capabilities Include:
- Variable-temperature crystal phase identification and quantification (X-Ray Diffraction in Parallel Beam and Bragg-Brentano geometries).
- Size, size-distribution, and shape analysis of nanocrystals, crystalline domains and pores, core and shell thickness determination in heterogeneous core/shell nanocrystals (Transmission and Reflection Small Angle Scattering including In-Plane measurements).
- Film thickness in single and multilayer morphologies (X-Ray Reflectivity).
- Stress analysis in films and heterogeneous nanomaterials (Stress Analysis).
- Quality control of epitaxial films and superlattices (Rocking curve, Reciprocal Space Mapping).
- Film texturing (Pole-Figure measurement).
- SmartLab model upgrade pending.
Contacts:
Sergei Ivanov
Sadhvikas Addamane
Research Highlight:
Formation of tubular conduction channel in a SiGe (P)/Si core/shell nanowire. heterostructure.
Wang, X.; Lin, Y.-C.; Tai, C.-T.; Lee, S. W.; Lu, T.-M.; Shin, S. H.; Addamane, S. J.; Sheeha.; Li, J.-Y.; Kim, Y.; Yoo, J. APL Materials 2022, 10.11: 111108. doi.org/10.1063/5.0119654
