An atomic force microscopy-based modulated nanomechanical measurement technique to probe the nanomechanical properties in 1D and 2D materials and their deformation mechanisms with sub-Angstrom and nN resolution.

General Capabilities include:

• Non-destructive measurements of the mechanical properties of ultra-thin materials with sub-Angstrom and nN resolutions.

• Measure mechanical and friction properties supported nanoscale objects ranging from nanotubes, to atomically thin materials, to nanocrystals not measurable with classical nanoindentation techniques.

Contact:
Remi Dingreville

Research Poster: Probing the Nanomechanics of 2D Materials

Research Highlight:
Probing the Mechanical Properties of 2D Materials via Atomic‐force‐microscopy‐based Modulated Nanoindentation.
Khan, R. M.; Rejhon, M.; Li, Y.; Parashar, N.; Riedo, E.; Wixom, R. R.; DelRio, F. W.; Dingreville, R.  Small Methods 2023. DOI:10.1002/smtd.202301043.