Aberration-corrected STEM with EDS and EELS allows us to both image and perform microanalysis of materials in the same experiment connecting structure and chemistry at nanometer and sub-nanometer length scales. Examples of materials analyzed include nanoparticles (e.g., core shell), epitaxial semiconductors and oxides, metals and alloys, battery materials, etc. We also have the ability to utilize most of the CINT specimen holders including cryogenic and heating.

Capabilities include:

• STEM imaging with Sub-atomic-scale resolution (80 pm at 200 kV; 120pm at 80 kV).
• STEM detectors:
  • High-angle annular dark-field (Z-contrast)
  • Bright-field
  • Segmented low-angle dark field
• Atomic-scale chemical mapping (~200 pm at 200 kV) by Energy X-ray Dispersive Spectroscopy (EDXS) and/or Electron Energy Loss Spectroscopy (EELS).
• Light element detection (by STEM imaging and/or EELS).
• Compatible with all CINT specimen holders: Inert transfer; cryogenic analysis (including cryo-transfer); heating; etc.

Contact:
Paul Kotula
Ping Lu

Research Highlight:
Atomic-scale chemical imaging and quantification of metallic alloy structures by energy-dispersive X-ray spectroscopy
Lu, P.; Zhou, L.; Kramer, M.J.; Smith, D.J. Scientific Reports. 2014, 4, 3945. doi.org/10.1038/srep03945

Analysis of Multilayer Devices for Superconducting Electronics by High-Resolution Scanning Transmission Electron Microscopy and Energy Dispersive Spectroscopy
Missert, N.; Kotula, P.G.; Rye, M.; Rehm, L.; Sluka, V.; Kent, A.D.; Yohannes, D.; Kirichenko, A.F.; Vernik, I.V.; Mukhanov, O.A.; Bolkhovsky, V.; Wynn, A.; Johnson, L.; Gouker, M. IEEE Trans.. Appl.. Supercond. 2017, 27, 1100704. doi.org/10.1109/TASC.2017.2669579