The Tecnai G2 F30 S-TWIN microscope is a versatile, general use microscope designed for high-resolution TEM and STEM characterization and equipped with multiple chemical analysis systems.
Capabilities include:
- Bright-field, dark-field, high-resolution TEM and STEM imaging and diffraction.
- Electron tomography to explore three-dimensional sample information.
- Electron holography to map electric and magnetic field distribution.
- Thin-window X-ray energy-dispersive spectroscopy (EDS) for quantitative nanoscale mapping of elements with Z>5.
- Electron energy-loss spectroscopy (EELS) for single-spectrum, line, and mapping chemical analysis in STEM or energy-filtered imaging in TEM (EFTEM).
General Specifications:
- Accelerating Voltage = 300 kV
- TEM Information Limit = 1.02 Å
- TEM Point Resolution = 2.0 Å
- STEM Point Resolution = 1.4 Å
- Spherical Aberration (Cs) = 1.2 mm
- Chromatic Aberration (Cc) = 2 mm
- EELS Energy Resolution = 0.7 eV
Detectors:
- TEM/Diffraction/Movies – Gatan Ultrascan 2k × 2k CCD, 4-30 fps.
- STEM – High-angle annular dark-field (HAADF), BF & DF detectors.
- EDS – EDAX thin-window SDD X-ray detector (30 mm2 active area, 0.13 srad).
- EELS – Gatan Tridiem 863 UHS.
Contacts:
Stephen House
Winson Kuo
Research Highlight: Phase evolution and structural modulation during in situ lithiation of MoS2, WS2 and graphite in TEMGhosh, C.; Singh, M. K.; Parida, S.; Janish, M. T.; Dobley, A.; Dongare, A. M.; Carter, C. B.
Scientific Reports 2021, 11 (1). doi.org/10.1038/s41598-021-88395-1
