Contact 

Doug Pete is a Technical Specialist at Sandia National Laboratory. Doug supports CINT Users utilizing the CINT Integration Lab.

Expertise

• Scanning electron microscopy
• Focused ion beam
• Electron beam lithography
• Atomic force microscopy
• Ultra-high vacuum systems
• Low temperature measurements for electrical and thermal characterization of nanoscale thin films

Capabilities

• High Resolution Scanning Electron Microscope, Focused Ion Beam, and Electron Beam Lithography

Education

BS, Chemical Engineering, University of New Mexico