Paul Kotula is a Distinguished Member of Technical Staff at Sandia National Laboratories with a long career pioneering novel microanalytical techniques and data analysis methods. Paul has experience characterizing a broad variety of materials, primarily using TEM/STEM imaging and microanalysis. He helped to build a robust research program centered on spectral imaging and data analytics, in which he played a crucial role in the FBI’s investigation of the 2001 anthrax attacks in Washington, DC. X-Ray analysis software developed as a part of this effort was later licensed to Thermo Fisher Scientific and is used in over 700 laboratories worldwide. Paul was first to develop 3D spectral imaging in the FIB-SEM along with data analysis of the resulting spectral image series and is involved with development of large solid-angle, quasi-annular x-ray detectors for ion- and electron-beam systems.
Expertise
Capabilities
Education
PhD, Materials Science, University of Minnesota Twin Cities
BS, Materials Science and Engineering, Cornell University
Awards
