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Winson Kuo is a Materials Scientist at Sandia National Laboratories specializing in advanced electron microscopy and spectroscopy for nanoscale-to-atomic scale characterization. Winson's work focuses on developing and applying SEM/(S)TEM/FIB and associated analytical techniques (EDS/WDS, EBSD, EELS) to connect structure and chemistry with functional properties and spans structural, electronic, magnetic, thermal, optical, and topological behavior. He also has deep experience in semiconductor failure analysis and reliability (process integration, interfaces, diffusion, irradiation-induced damage, and resistive-switching devices), as well as broader materials degradation, defect analysis, and quality-control metrology problem solving. Winson leads facility operations and capability development, supports and trains diverse user communities, and collaborates across national labs, academia, and industry.

Expertise

• Advanced electron microscopy & spectroscopy for materials characterization (SEM, (S)TEM, FIB; EDS/WDS, EBSD, EELS)
• In-Situ and cryogenic microscopy method development and application
• Structure–property relationships across functional materials (structural, electronic, magnetic, thermal, optical, topological)
• Semiconductor failure analysis & device reliability (interfaces, diffusion, irradiation damage, resistive-switching devices)
• Materials degradation mechanisms, defect analysis, and nanoscale metrology
• Magnetic materials processing and characterization

Capabilities

• Scios 2 Focused Ion Beam Scanning Electron Microscope for Materials Characterization and TEM Sample Preparation
• Tecnai G2 F30 S-TWIN Microscope

Education

PhD, Metallurgy, University of Birmingham
MS, Materials Science, National Taiwan Ocean University
BS, Industrial Design and Mechanical Engineer (LIC), Da-Yeh University

Awards

• Fellow (FRMS), Royal Microscopical Society, 2016
• Honorary Research Fellow, Wolfson Catalysis Centre, University of Oxford, 2013